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Pandey, Nitesh and Hennelly, Bryan M. (2011) Effect of additive noise on phase measurement in digital holographic microscopy. 3D Research, 2 (1). p. 6. ISSN 2092-6731
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Abstract
Digital holographic microscopy is a quantitative
phase measurement technique that can provide nanometer
resolution of the thickness or surface profile of an object.
We analyze the influence of additive noise in the hologram
plane on the accuracy of phase measurement. We analyze
Gaussian distributed and Poisson distributed shot noise in
the camera plane and we develop a model for quantifying
the phase error in the reconstructed phase.
| Item Type: | Article |
|---|---|
| Keywords: | Noise; Phase Measurement; Digital Holographic Microscopy; |
| Academic Unit: | Faculty of Science and Engineering > Computer Science Faculty of Science and Engineering > Electronic Engineering Faculty of Science and Engineering > Research Institutes > Hamilton Institute |
| Item ID: | 8714 |
| Identification Number: | 10.1007/01(2011)6 |
| Depositing User: | Dr. Bryan Hennelly |
| Date Deposited: | 04 Sep 2017 11:27 |
| Journal or Publication Title: | 3D Research |
| Publisher: | Springer |
| Refereed: | Yes |
| Funders: | European community's seventh framework programme FP7/2007-2013, Science Foundation Ireland |
| Related URLs: | |
| URI: | https://mu.eprints-hosting.org/id/eprint/8714 |
| Use Licence: | This item is available under a Creative Commons Attribution Non Commercial Share Alike Licence (CC BY-NC-SA). Details of this licence are available here |
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