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Hogan, John and Farrell, Ronan (2005) Voltage to Frequency Converter for DAC Test. Proceedings of the SPIE, 5837. pp. 522-533.
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Abstract
In this paper a modified relaxation oscillator is proposed as the core of an analog to digital modulator for on chip signal
extraction for test. The architecture uses digital current source generation and digital switching in place of active
circuitry. The resulting design allows for high input sensitivity, robustness to component variation while occupying little
silicon area. This paper provides solutions on the main challenges in implementing this modulator and how it may be
integrated with a digital based tester.
| Item Type: | Article |
|---|---|
| Additional Information: | Copyright 2004 Society of Photo-Optical Instrumentation Engineers. This paper was published in [add journal or proceedings bibliographic information] and is made available as an electronic reprint with permission of SPIE. One print or electronic copy may be made for personal use only. Systematic or multiple reproduction, distribution to multiple locations via electronic or other means, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper are prohibited. |
| Keywords: | Mixed signal testing, data converters, oscillators. |
| Academic Unit: | Faculty of Science and Engineering > Electronic Engineering |
| Item ID: | 591 |
| Depositing User: | Ronan Farrell |
| Date Deposited: | 04 Jul 2007 |
| Journal or Publication Title: | Proceedings of the SPIE |
| Publisher: | Society of Photo-Optical Instrumentation Engineers |
| Refereed: | Yes |
| URI: | https://mu.eprints-hosting.org/id/eprint/591 |
| Use Licence: | This item is available under a Creative Commons Attribution Non Commercial Share Alike Licence (CC BY-NC-SA). Details of this licence are available here |
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